| Summary: | 碩士 === 國立臺灣科技大學 === 自動化及控制研究所 === 96 === An edge tracing measurement integrated circuit (IC) using System-on-a-programmable-chip (SOPC) technology is presented in this thesis. In the proposed measurement IC, there are two modules. One module is implemented by hardware circuit, which functions are Complementary metal-oxide-semiconductor (CMOS) image sensor signal capture and scheme Nios II microprocessor. The other module is implemented by software using Nios II microprocessor, which functions are writing registers of CMOS image sensor using Inter-integrated circuit (I2C) and the edge tracing measurement algorithm, such as Otsu’s method, Laplacian operator, thinning, chain code, subpixel theorem and so on. The digital hardware circuits are designed by Verilog language and programed in Nios II microprocessor coded in C language. The Field-programmable gate array (FPGA) chip adopts ALTERA Stratix II EP2S60F672C3N on the development board. The CMOS color image sensor adopts PIXART PAS6311LT which resolution is 648×488 pixels. At last, an integrated experimental system that includes Nios II development board, three degree of freedom parallel mechanism and CMOS image sensor is implemented. The experimental results verify the feasibility and correctness of the proposed measurement system.
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