Analysis of LED Die-Imaging and Yellow Hue Phenomena in TIR Lens

• Main Authors: I-Ju Chen, 陳怡如
• Other Authors: Allen Jong-Woei Whang
• Format: Others
• Language: zh-TW
• Published: 2008
• Online Access: http://ndltd.ncl.edu.tw/handle/79804579304303747396

碩士 === 國立臺灣科技大學 === 光電工程研究所 === 96 === For various applications designers often use secondary optical elements of LEDs to make proper adjustments of the optical properties. Therefore secondary optical design is more important. Secondary optical designs for LEDs have to deal with Die-Imaging and Yellow Hue phenomena. In this literature signal optical element LED with a TIR Lens, issued. First part is focus on the relationship between the die-imaging phenomenon and the TIR lens design of point-to-point and point-to-plane. Producing yellow hue phenomenon in secondary optical design is unavoidable because the LEDs with defects in the manufacture. Our goal is to simulate a TIR lens with a white LED by TracePro. For identifying the seriousness of yellow hue phenomenon we via color difference method. Set up a set of simple and easy method to make a diagnosis.