A Self-Testable Delta-Sigma Modulator for Built-on-Scribe-Line TFT LCD Source Driver Testing
碩士 === 國立臺灣大學 === 電子工程學研究所 === 96 === In this thesis, we present a low-cost wafer-level test methodology for the source driver ICs of liquid crystal displays; the idea is to realize the test circuitry on the wafer scribe line. The proposed technique not only substantially reduces the required ATE I/...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2008
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| Online Access: | http://ndltd.ncl.edu.tw/handle/66106229178462556244 |