Transition Fault Diagnosis Using At-Speed Scan Patterns with Multiple Capture Clocks
碩士 === 國立臺灣大學 === 電子工程學研究所 === 96 === This thesis presents a diagnosis technique to locate transition faults using scan patterns with multiple capture clocks which are applied at speed. To quickly locate the candidate faults, a two-level search is proposed. The circuit is first partitioned into fa...
| Main Authors: | , |
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2008
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| Online Access: | http://ndltd.ncl.edu.tw/handle/72786852707305269971 |