Influence of Light Beam Polarization State in Aperture Scanning Near-Field Optical Microscope

• Main Authors: Chi-Kuon Wang, 王繼孔
• Other Authors: 李世光
• Format: Others
• Language: en_US
• Published: 2008
• Online Access: http://ndltd.ncl.edu.tw/handle/13483617951432578753

碩士 === 國立臺灣大學 === 工程科學及海洋工程學研究所 === 96 === In conventional far-field optics, the resolution of optical microscope system is constrained by the diffraction limit. However, the research in the 20th century verified that optical limit can be overcome in near-fields. Furthermore, near-field optics has advanced to a new research region as many new topics have developed over the years. These new fields include evanescent optics, surface-plasmon resonance and nano-photonics, etc. Scanning near-field optical microscopy (SNOM) is another important research in near-filed optics, and it is also a crucial tool to get near-field optical information. Recently, the development of scanning near-field optical microscope system is almost complete. However, the researches and discussions of SNOM probe types and its effects are still relatively less explored. For this reason, I investigated the aperture-SNOM probes and fabricated it to complete my thesis. Moreover, I tried to explore further to see if the Surface-Plasmon Polaritons (SPPs) effects exit at the surface of silver-coated tips with a hope to enhance the resolution of SNOM. I thus simulated it by using FDTD simulation software and discussed the influence of different polarization states in SNOM. At last, in order to ensure the ability of the probes that I fabricated, I utilized the probes in the near-field optical heterodyne interferometer and obtained the near-field optical and phase images which obtained better results than previous works.