Resolving Small Period of Nano Scale Recording Bits on Phase-Change Material

• Main Author: 吳宗遠
• Other Authors: Hai-Pang Chiang
• Format: Others
• Language: zh-TW
• Published: 2008
• Online Access: http://ndltd.ncl.edu.tw/handle/94592439874865696989

碩士 === 國立臺灣海洋大學 === 光電科學研究所 === 96 === In this thesis, the different writing strategies (2T8T, 2T6T, 2T4T, 2T1T, 2T=100 nm; 2T2T, 2T=50 nm ) and writing power were used to write the recording marks on the commercial rewritable DVD disk(DVD+RW). The Carrier to Noise Ratio (CNR) measurements were carried out using the dynamic optical disk tester. In order to understand the relationship with different writing strategy, writing power and recording mark size, we used the conductive atomic force microscope(C-AFM) to investigate the surface current signal of recording marks. In this experiment, the minimal size of recording mark is 16 nm.