A Power Efficient, Fully Digital Interface, On-Line Thermal/Power Monitoring System

碩士 === 國立清華大學 === 電機工程學系 === 96 === Due to the advance in CMOS technology and design complexity, more power is dissipated in smaller die area, thus the thermal density of modern VLSI systems is becoming a critical issue. High die temperature can not only degrade circuit performance but also leads to...

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Bibliographic Details
Main Authors: Yen-Yuan Chen, 陳彥淵
Other Authors: Tsin-Yuan Chang
Format: Others
Language:en_US
Published: 2008
Online Access:http://ndltd.ncl.edu.tw/handle/53644987095075606781