Burn-in Cost Reduction Using the Heat Produced by Applying Test Patterns
碩士 === 國立清華大學 === 電機工程學系 === 96 === In IC manufacturing, burn-in test (a kind of accelerated test) played an important part in early-life latent failures detecting. It ensures high quality and reliability of manufactured ICs before shipping them to customers. Typically, the tester needs to provide t...
| Main Authors: | , |
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| Format: | Others |
| Language: | en_US |
| Published: |
2008
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| Online Access: | http://ndltd.ncl.edu.tw/handle/83728372821157496100 |