Formation, Characterization and properties of un-doped and Al-doped vanadium oxide 1-D nanostructures by thermal evaporation

• Main Authors: Su, Yu-Chun, 蘇育群
• Other Authors: Shih, Han C.
• Format: Others
• Language: zh-TW
• Published: 2008
• Online Access: http://ndltd.ncl.edu.tw/handle/82025711402413905297

碩士 === 國立清華大學 === 材料科學工程學系 === 96 === In this work, pure V2O5 and Al-doped V2O5 1-D nanostructures have been synthesized by thermal evaporation. The nanostructures were successfully synthesized with horizontal tube furnace by using vanadium pentoxide and aluminum powder. The morphology of nanostructures was analyzed by field emission scanning electron microscope (FESEM). It is shown that the appearance of nanostructures is nanorods with diameter ranging between 50 and 200 nm and with lengths extending up to several microns. High resolution transmission electron microscopy (HRTEM) micrographs and selection area electron diffraction (SAED) patterns of V2O5 nanorods clearly show that they are single-crystalline with a growth direction of [020]. The structures and component were characterized by means of X-ray diffraction (XRD), energy dispersive X-ray spectroscopy (EDS), X-ray photoelectron spectroscopy (XPS) and Micro-Raman Spectroscopy. The properties of Al-doped and un-doped V2O5 nanorods were investigated by Photoluminescence (PL), I-V curve and gas sensor. The pure V2O5 nanorods gave emission~650 nm but the emission of Al-doped V2O5 nanorods blue shifted to 610nm. The resistivity of the single nanorods increasing is result of aluminum doping. Furthermore,aluminum addition adjusted the sensitivity of nanorods.