Building the Golden Die Analytical Model at R&D Stage with WAT Parameters in Semiconductor Manufacturing
碩士 === 國立清華大學 === 工業工程與工程管理學系 === 96 === For semiconductor manufacturing industries, they usually have formed very high production costs because of the complicated manufacturing process of the manufacturing environment and expensive equipments. Almost every semiconductor company expects to reduce co...
Main Authors: | Chi-Sheng Chang, 張其聖 |
---|---|
Other Authors: | 陳飛龍 |
Format: | Others |
Language: | zh-TW |
Published: |
2008
|
Online Access: | http://ndltd.ncl.edu.tw/handle/86787840675723173599 |
Similar Items
-
Golden Die Clustering Analysis at R&D Stage with WAT Parameters in Semiconductor Manufacturing
by: 游淑敏
Published: (2008) -
A Systematic Golden Die Sampling Analysis Model with WAT Parameters at Semiconductor R&D Stage
by: Chen, Yi-Hsin, et al.
Published: (2009) -
Using Adaptive Resonance Theory Network II to Analyze Golden Die Clustering Model at R&D Stage in Semiconductor Manufacturing
by: 羅士健
Published: (2011) -
Modeling of Wafer Die Yield by WAT Parameters
by: Chen-Yu Wang, et al.
Published: (2007) -
Die grotere soogdiere wat vroër dae voorgekom het in die omgewing van die Golden Gate-Hooglandpark
by: L. C. C. Liebenberg
Published: (1964-05-01)