Study on the Polycrystalline Silicon Thin-Film Transistors with Location-Controlled Grain Boundary and Multi-Gate Stucture Using Excimer Laser Annealing
碩士 === 國立交通大學 === 電子工程系所 === 96 === In recent years, polycrystalline silicon (poly-Si) thin film transistors (TFTs) were the key devices in flat-panel display technology and System on a Panel (SOP) applications due to its high mobility. Although conventional excimer laser can transfer amorphous Si t...
Main Authors: | Syu-Heng Lee, 李序恆 |
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Other Authors: | Huang-Chung Cheng |
Format: | Others |
Language: | en_US |
Online Access: | http://ndltd.ncl.edu.tw/handle/4zekmh |
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