Scan-Chain Reordering for Minimizing Scan-Shift Power Based on Non-Specified Test Cubes
碩士 === 國立交通大學 === 電子工程系所 === 96 === This thesis proposes a scan-cell reordering scheme based on unspecified test vectors to reduce the signal transitions during test mode while preserving the don’t-care bits in the test patterns for a later optimization. First, we introduce a method that uses respon...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2007
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| Online Access: | http://ndltd.ncl.edu.tw/handle/9dh9zw |