A Universal Test Platform for Microcontrollers
碩士 === 國立交通大學 === 電機學院碩士在職專班電子與光電組 === 96 === The data sheets are an important technical manual for MCU users. It is impossible to know if MCU work well, or to get the data for AC/DC characteristics, when MCU is being used beyond the conditions specified on data sheets. The only way to get the data,...
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2007
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| Online Access: | http://ndltd.ncl.edu.tw/handle/00893502465137028938 |
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ndltd-TW-096NCTU51240092016-05-18T04:13:15Z http://ndltd.ncl.edu.tw/handle/00893502465137028938 A Universal Test Platform for Microcontrollers 通用型微控制器測試平台 張家志 碩士 國立交通大學 電機學院碩士在職專班電子與光電組 96 The data sheets are an important technical manual for MCU users. It is impossible to know if MCU work well, or to get the data for AC/DC characteristics, when MCU is being used beyond the conditions specified on data sheets. The only way to get the data, when MCU is working out of specification, is to do the test directly. However, it is a difficult and time-consuming job to do the test for MCU by manpower. The purpose of this thesis is trying to create a low-cost and easy-to-use test platform for MCU. Through this platform, users can finish all the tests and get necessary AC/DC characteristics under different conditions in a short time. 黃宇中 2007 學位論文 ; thesis 92 zh-TW |
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NDLTD |
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zh-TW |
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Others
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NDLTD |
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碩士 === 國立交通大學 === 電機學院碩士在職專班電子與光電組 === 96 === The data sheets are an important technical manual for MCU users. It is impossible to know if MCU work well, or to get the data for AC/DC characteristics, when MCU is being used beyond the conditions specified on data sheets. The only way to get the data, when MCU is working out of specification, is to do the test directly. However, it is a difficult and time-consuming job to do the test for MCU by manpower.
The purpose of this thesis is trying to create a low-cost and easy-to-use test platform for MCU. Through this platform, users can finish all the tests and get necessary AC/DC characteristics under different conditions in a short time.
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| author2 |
黃宇中 |
| author_facet |
黃宇中 張家志 |
| author |
張家志 |
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張家志 A Universal Test Platform for Microcontrollers |
| author_sort |
張家志 |
| title |
A Universal Test Platform for Microcontrollers |
| title_short |
A Universal Test Platform for Microcontrollers |
| title_full |
A Universal Test Platform for Microcontrollers |
| title_fullStr |
A Universal Test Platform for Microcontrollers |
| title_full_unstemmed |
A Universal Test Platform for Microcontrollers |
| title_sort |
universal test platform for microcontrollers |
| publishDate |
2007 |
| url |
http://ndltd.ncl.edu.tw/handle/00893502465137028938 |
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AT zhāngjiāzhì auniversaltestplatformformicrocontrollers AT zhāngjiāzhì tōngyòngxíngwēikòngzhìqìcèshìpíngtái AT zhāngjiāzhì universaltestplatformformicrocontrollers |
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