A Universal Test Platform for Microcontrollers
碩士 === 國立交通大學 === 電機學院碩士在職專班電子與光電組 === 96 === The data sheets are an important technical manual for MCU users. It is impossible to know if MCU work well, or to get the data for AC/DC characteristics, when MCU is being used beyond the conditions specified on data sheets. The only way to get the data,...
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| Format: | Others |
| Language: | zh-TW |
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2007
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| Online Access: | http://ndltd.ncl.edu.tw/handle/00893502465137028938 |
| Summary: | 碩士 === 國立交通大學 === 電機學院碩士在職專班電子與光電組 === 96 === The data sheets are an important technical manual for MCU users. It is impossible to know if MCU work well, or to get the data for AC/DC characteristics, when MCU is being used beyond the conditions specified on data sheets. The only way to get the data, when MCU is working out of specification, is to do the test directly. However, it is a difficult and time-consuming job to do the test for MCU by manpower.
The purpose of this thesis is trying to create a low-cost and easy-to-use test platform for MCU. Through this platform, users can finish all the tests and get necessary AC/DC characteristics under different conditions in a short time.
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