Reducing Static and Dynamic Power in Scan Testing
碩士 === 國立中興大學 === 資訊科學與工程學系 === 96 === Static power due to leakage current will become a major source of power consumption in the nanometer technology era. In this paper, we propose a simple yet effective technique for static and dynamic power reduction in the scan test process. The leakage current...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2008
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| Online Access: | http://ndltd.ncl.edu.tw/handle/67029547627699981970 |