Analysis of dynamic force microscopy measuring nano-scale electrostatic force and working function
碩士 === 崑山科技大學 === 機械工程研究所 === 96 === The analytical method to determine the frequency shift in dynamic force microscopy subjected to the electrostatic force is proposed. The frequency shift of higher mode can be determined easily and precisely by the proposed method. It is well known that the second...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2008
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| Online Access: | http://ndltd.ncl.edu.tw/handle/67697872991798127522 |