Applying Incremental Learning-based SVM to Gate-Electrode Mask Defect Classification for the Inline Inspection of TFT-LCD Array Engineering
碩士 === 中原大學 === 機械工程研究所 === 96 === For current TFT-LCD manufacturer, one of the most important goals is to enhance the yield rate and reduce the production cost. To enhance the yield rate, most companies have set up the inspection departments to manually perform the task of defect classification. A...
| Main Authors: | , |
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2008
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| Online Access: | http://ndltd.ncl.edu.tw/handle/29404148408945158003 |