Polarized multi-color digital holographic microscope

碩士 === 國立中正大學 === 光機電整合工程所 === 96 === Digital holography is one kind of optical measurement which have the important characteristics of non-contact and high resolution. Off-axis digital holographic microscope (DHM) is a technique of performing measurement by single hologram acquisition. As a result...

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Bibliographic Details
Main Authors: Tang-Lie Zhao, 趙堂烈
Other Authors: Zheng-Xiong Chen
Format: Others
Language:zh-TW
Published: 2008
Online Access:http://ndltd.ncl.edu.tw/handle/47056512516856139670
Description
Summary:碩士 === 國立中正大學 === 光機電整合工程所 === 96 === Digital holography is one kind of optical measurement which have the important characteristics of non-contact and high resolution. Off-axis digital holographic microscope (DHM) is a technique of performing measurement by single hologram acquisition. As a result, it reduce the susceptibility to the environment vibration. Holography is a well-proven method to quickly catch the 3D information of a sample by one-shot measurement and to provide the high resolution of measurement. This paper is focused on the measurement of micro-three-dimensional object by using the multicolor digital holographic microscope (MDHM). Three lasers with different wavelength and polarization consist of the light source of the DHM. The basic light path of architecture is Mach–Zender interferometer, and the reference wave is oriented such that the reference wave reaches the CCD camera with a small incidence angle. We use color CCD camera for one-shot recording, and utilize digital reconstruction to produce unwrapped phase images. The numerical reconstruction method consists basically of calculating the Fresnel diffraction pattern of the hologram. Polarized multi-color digital holographic microscope can be used to extend the axial range of the object being imaged by one shot. And it can reconstruct the range of the surface axial about 15.395um without phase ambiguity. So Polarized multi-color digital holographic microscope has an advantage of fast measurement and elimating the phase wrapping.