Mismatch Address Index Encoding for Data Compression in Scan Test
碩士 === 元智大學 === 資訊工程學系 === 95 === During the last decade, as the VLSI technology grows up, high performance, low-cost, high density integrated circuits became main stream. Hence, testing for integrated circuit is more and more complex. For example, augmentation of test data, prolonged test time, hig...
| Main Authors: | , |
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| Format: | Others |
| Language: | en_US |
| Online Access: | http://ndltd.ncl.edu.tw/handle/80749659924663809303 |