| Summary: | 碩士 === 元智大學 === 工業工程與管理學系 === 95 === The technique in manufacturing Flat Monitors develops very fast in this decade, while the retail prices are declining gradually, thus the competition in flat monitor market is vigorous and rapid. For the plasma monitors, the target functionality of the products reveals after a filter glass is attached to the surface of the monitor. However, it can cause higher defective rate in the optical film lamination process. Thus, in this thesis, we implement Six Sigma (Define、Measure、Analyze、Improve and Control) to improve the defective rate of optical film lamination process.
The first step of the procedure in Six Sigma is to determine Colloidal Particle and DOT in the process as two key factors in the quality and measurement system. Then SIPOC is used to make analysis. First, 24 possible factors are sorted out by the Pareto chart and 12 potential factors are concluded which may influence procedure workflow potentially by the method of C & E MATRIX.
A partial factorial design, , is applied to executive design of experiment for the first time and then a reflected design of is performed to distinguish main from interaction effects. A partial reflected design of can confirm the significant effects between two interaction effects. Finally, a cubic plot shows the best combination of the levels of active factors in the manufacturing which is the combination of all low levels.
A Six Sigma method is implemented successfully to the target company for increasing the yield in the optical film lamination process. Our experimental results and procedures can be contributed to the company in improving the quality, increasing the stability of the yield rate and production procedure. From this study, we can understand and determine the active factors which affect the yield rate in the process by a systematic way- Six Sigma. We expect our research results can be applied to other manufacturing processes in the company to increase the yield rates significantly.
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