Measurement platform system for wireless communication
碩士 === 國立臺北科技大學 === 機電整合研究所 === 95 === This study aim to develop a measurement platform system for communication product that include hardware instrument and software interface. The system can fix DUT (Device Under Test), turn DUT to assigned test position in the chamber and upgrade the 2D measureme...
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2007
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| Online Access: | http://ndltd.ncl.edu.tw/handle/csryfz |
| Summary: | 碩士 === 國立臺北科技大學 === 機電整合研究所 === 95 === This study aim to develop a measurement platform system for communication product that include hardware instrument and software interface. The system can fix DUT (Device Under Test), turn DUT to assigned test position in the chamber and upgrade the 2D measurement to 3D measurement system with two-axis rotation capability. Because the fixture and mechanic components in the chamber allow less reflective EM wave, all materials of the components in the chamber must have low dielectric and have less EM effect. There are many factories effect the measurement result. If we can find and control the key factor, we can get the best test result. This study applies “factorial design of experiments” method to find out the main effect factor of radiation test and try to improve the EM effect of the measurement platform. Finally, we can develop one kind of 3D measurement platform with low EM reflection and high performance.
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