The Optimum Design for Accelerated Degradation Experiments with Linear Random Coefficient Model
碩士 === 東海大學 === 統計學系 === 95 === ================================== [ ABSTRACT ] ================================== Traditional accelerated life tests (ALT's) record failure and censoring times of devices subjected to elevated stress. For highly reliability devices, ALT's provide little in...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2007
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| Online Access: | http://ndltd.ncl.edu.tw/handle/73970823279579672416 |