Nanoindentation Characteristics using Finite Element Method combined with Abductive Network

• Main Authors: Cheng-liang Ke, 柯正良
• Other Authors: Te-Hua Fang
• Format: Others
• Language: zh-TW
• Published: 2007
• Online Access: http://ndltd.ncl.edu.tw/handle/chngwn

碩士 === 國立虎尾科技大學 === 機械與機電工程研究所 === 95 === The purpose of the present work was to investigate the nanoindentation process by FEM of metals, considering strain hardening effect of material. In order to verify the FEM simulation results of the mechanical parameters such as Young’s modulus, yield stress and strain hardening, and the experimental data are compared with the results of the current simulation. The abductive network was then applied to synthesize the data sets obtained from the numerical simulation. The predicted results of the mechanical properties from the prediction model are consistent with the results obtained from experiment. After employing the predictive model can provide valuable references in prediction of the mechanical parameters after nanoindentation tests. We used finite element method to is it keep mark test consumed time and metal mechanical range too big to select suitable materials difficult characteristics to avoid, can predict and analyzed the mechanical characteristics of the metal in the finite element method accurately by one kind of abductive network. But the simulation that does with finite element analysis presses the mark and tests the after treatment materials and trains the database for abductive network, because the experiment load curve has not conformed with imitate the load curve trend, and not enough to laminate, then in order to analyze the mechanical characteristics of the metal effectively , utilize two ways separately, attempt to be estimated the mechanical nature of analyzing the metal in advance by these two ways, but the time that its main purpose consumes in order to utilize the finite element in a large amount sparingly, effective and accurate mechanical characteristics and hardness of metals in advance.