Using program to simulate and analyze the defects happened in Liquid Crystal Display Module

• Main Authors: Hsin-Yueh Wu, 吳信岳
• Other Authors: Fuh-Shyang Juang
• Format: Others
• Language: zh-TW
• Published: 2007
• Online Access: http://ndltd.ncl.edu.tw/handle/g7h3xu

碩士 === 國立虎尾科技大學 === 光電與材料科技研究所 === 95 === This thesis aimed to use the most efficient and fastest computer program analyzing method to stratify the root cause of malfunctioning of Liquid Crystal Display Modules (LCMs) occurred on the production line or at the client side, in order to solve the malfunctions immediately. Among the LCMs, the problems of IC parts and LCD Cells are the most difficult to identify. If using regular Stratification to stratify the malfunctions by cross examination after disassembling the IC parts and LCD cells that will be time-consuming and waste manpower and resource. Also, the disassembly procedure may have risk to damage the IC parts and LCD cells. Using computer program analyzing method could stratify the root cause of malfunction without disassembly, and the “Display off” command in the computer program provides the IC Supply Voltage (VDD) to the IC for internal operation, but the IC inside does not provide LCD cell Operating Voltage (VOP) to LCD. Even the IC inside continues to work, the signal outputs to the LCD cell is turned off. Then the IC power consumption is observed to stratify the malfunctioning occurred in IC parts or LCD cells. “COM direction” command can change the scanning direction to change the direction of IC signal to stratify the malfunctions of IC or LCD cells rapidly. If the IC signal transmission direction changed and the malfunction changed as well, that indicates the defect is irrelevant to LCD ITO circuits. On the contrast, if the malfunction persists, it indicates there would be circuit problems in LCD ITO. The computer program analyzing method also could be conducted into production line for malfunctions inspection which means applying high frequency in computer programs to inspect out the malfunctions of ITO circuit. This analyzing method also could drive each ITO circuit of LCD cell gradually to examine the malfunctions as short circuit.