Improved neural network-based control chart pattern recognition using raw data and statistical data simultaneously
碩士 === 國立虎尾科技大學 === 工業工程與管理研究所 === 95 === Control chart patterns (CCPs) can be used to determine the status of system. Unnatural CCPs can be associated with a particular set of assignable causes for process variation. In recent years, artificial neural networks (ANNs) have been successfully used in...
| Main Authors: | , |
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2007
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| Online Access: | http://ndltd.ncl.edu.tw/handle/3w7gk4 |