Research and Development of Intelligent On-line Real time Defect Inspection System for Polarizer
碩士 === 國立臺灣科技大學 === 高分子系 === 95 === This research applied digital image processing technology to the defect inspection of polarizer products. It first used line scan charged couple device (CCD) to screen the defect images, and then reduced the defect image ( pixel) to four times smaller using downsa...
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2007
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| Online Access: | http://ndltd.ncl.edu.tw/handle/t9kczp |