A Low Power Test Pattern Generation Methodology for Scan Testing
碩士 === 國立臺灣大學 === 電機工程學研究所 === 95 === Average and peak power management has become a serious challenge for scan-based testing. This thesis proposes a test pattern generation methodology that reduces the power dissipation during the shift and capture cycles of conventional scan testing. The proposed...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2007
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| Online Access: | http://ndltd.ncl.edu.tw/handle/10268214800467270201 |