Complemented Response Cell (CRC) : A Low Peak Power design for Testability Technique

碩士 === 國立臺灣大學 === 電子工程學研究所 === 95 === This thesis presents a novel low peak power DFT technique, called Complemented Response Cell (CRC), to reduce the peak power at the system clock. This technique controls the data input of specified scan cells such that their contents remain unchanged before and...

Full description

Bibliographic Details
Main Authors: Bo-Hua Chen, 陳勃樺
Other Authors: Chien-Mo Li
Format: Others
Language:en_US
Published: 2006
Online Access:http://ndltd.ncl.edu.tw/handle/82918884996417308323

Similar Items