TEM Observation and Analysis of Porous Silicon
博士 === 國立臺灣大學 === 材料科學與工程學研究所 === 95 === Porous silicon was discovered since 1956, due to its unique optical and electrical properties, it’s still remaining in focus in these decades. The reasons that cause these unique properties are still a puzzle. Someone says that’s because of nano-rod, another...
Main Authors: | Ting-Yu Wang, 王廷玉 |
---|---|
Other Authors: | 楊哲人 |
Format: | Others |
Language: | zh-TW |
Published: |
2007
|
Online Access: | http://ndltd.ncl.edu.tw/handle/90967507916035841952 |
Similar Items
-
TEM investigation of silicon devices
by: Lindsay, Richard
Published: (1998) -
Porous Silicon Photodetector
by: Wang, Yu Hsiung, et al.
Published: (1996) -
A Study of The Optical-Electrical Properties of Porous Silicon and the Observation of NDR phenomenon in Porous Silicon Superlattice
by: Hao-Yi Tsai, et al.
Published: (1996) -
Observing the morphology of single-layered embedded silicon nanocrystals by using temperature-stable TEM membranes
by: Sebastian Gutsch, et al.
Published: (2015-04-01) -
AFM, SEM and TEM Studies on Porous Anodic Alumina
by: Zhu YuanYuan, et al.
Published: (2010-01-01)