Inspection of High-Resolution Printed Labels in a PC-based Cluster Computing Environment

• Main Authors: Yi-Kai-Huang, 黃羿凱
• Other Authors: Chin-Chun Chang
• Format: Others
• Language: zh-TW
• Published: 2007
• Online Access: http://ndltd.ncl.edu.tw/handle/92965776272104835552

碩士 === 國立臺灣海洋大學 === 資訊工程學系 === 95 === Abstract The goods of daily life all have labels. Some of the printing labels may have defects caused by the malfunction of the printing machine. To ensure the quality of the printed labels of high-cost goods, every printed label should be inspected. Since such a printed label inspection system is often an on-line system, the automatic printed label inspection system should be capable of checking the quality of a printed label as fast as the printing machine. However, the computing requirement of such a system is beyond the computing capability of a general personal computer because the image of a printed label has a huge mount of data. In this thesis, a PC-based cluster computing environment is established to build a low-cost, high-speed, and high-flexibility printed label inspection system. The simulation results have proven the feasibility of the proposed approach.