Flash Memory Fault Diagnostics and Test Time Reduction
博士 === 國立清華大學 === 電機工程學系 === 95 === With the increase in size and capacity of flash memory, long test times on complicated automatic test equipment (ATE) are now commonly seen. The test-consuming diagnosis process for ATEs results in high test cost and slow time-to-volume; thus, efficient diagnosis...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2006
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| Online Access: | http://ndltd.ncl.edu.tw/handle/17431113582352240010 |