Universal Multi-Casting Scan for Logic IC's
碩士 === 國立清華大學 === 產業研發碩士積體電路設計專班 === 95 === We present a Universal Multicasting Scan (UMC-Scan) architecture for test compression. With some hardware support, this scheme allows universal multicasting by which we mean that one is able to shift in a test pattern to arbitrary set of scan chains as lon...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2007
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| Online Access: | http://ndltd.ncl.edu.tw/handle/84053046245741274407 |