Investigation of the Mechanical Stress-Induced Shift and Variation of Electrical Characteristics in the Analogic Device and MOSFETs
博士 === 國立清華大學 === 動力機械工程學系 === 95 === Recently, the integrated circuit trends to have more and more complex with multi-functions but smaller and smaller in size. For this reason, it needs much more exact calculation and desination for electrical characteristics. Poor design and process-induced mecha...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2007
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| Online Access: | http://ndltd.ncl.edu.tw/handle/28031994899465126048 |