Using CART Algorithm to Develop the Relation Model between Bin Yield and WAT Parameters
碩士 === 國立清華大學 === 工業工程與工程管理學系 === 95 === In recent years, new technologies have been designed in semiconductor fabrication and led to design delicate electronic product widely used by public in application purpose. Moreover, new technologies make electronic industry a skyrocket and one of the most i...
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| Format: | Others |
| Language: | zh-TW |
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2007
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| Online Access: | http://ndltd.ncl.edu.tw/handle/21882595750206534552 |