The Study and Simulation of the Line Pattern having large Depth of Focus by using only Single Exposure and Binary Mask

碩士 === 國立交通大學 === 電子工程系所 === 95 ===

Bibliographic Details
Main Authors: Jen-Chieh Tsao, 曹人傑
Other Authors: Jen-Chung Lou
Format: Others
Language:en_US
Published: 2007
Online Access:http://ndltd.ncl.edu.tw/handle/33069964957572258310
Description
Summary:碩士 === 國立交通大學 === 電子工程系所 === 95 ===