Investigation of Electrical Properties and Reliabilities of Chip-on-Glass(COG)with Compliant Bumps
碩士 === 國立交通大學 === 材料科學與工程系所 === 95 === Non conductive film(NCF)is widely adopted by flat panel display(FPD)industry in chip-on-glass(COG)bonding method it provides low processing temperature and low product cost. As revealed by four-point test, the contact resistances of bumps subjected to six therm...
Main Authors: | Chung Kuang Lin, 林宗寬 |
---|---|
Other Authors: | Chih Chen |
Format: | Others |
Language: | zh-TW |
Published: |
2007
|
Online Access: | http://ndltd.ncl.edu.tw/handle/63069413656528339922 |
Similar Items
-
Electromigration in flip-chip solder joints: Effect of temperature on failure mechanism and analysis of bump resistance curves
by: Lin, Chung-Kuang, et al.
Published: (2014) -
Investigations on Flip Chip Solder Bump and Under Bump Metal
by: Chien-Tai Lin, et al.
Published: (2004) -
A Study of Al/PI Composite Bump Applied to COG Process
by: Jeng, Jen-Huang, et al.
Published: (1996) -
Electromigration and chip-package interaction reliability of flip chip packages with Cu pillar bumps
by: Wang, Yiwei
Published: (2012) -
The Reflow Process and Properties of the Flip Chip Solder Bumps
by: Liu, Yi-Cheng, et al.
Published: (1998)