The Elliposometric Measurements of a curved surface
碩士 === 國立交通大學 === 光電工程系所 === 95 === This work presents a three-intensity measurement technique to determine the ellipsometric parameters (Ψ,Δ) of a curved surface in a polarizer–sample-analyzer (PSA) imaging ellipsometry. After a careful calibration on the azimuth position of the water-surface, we...
Main Authors: | Chen Yo Lee, 李振佑 |
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Other Authors: | Y. F. Chao |
Format: | Others |
Language: | zh-TW |
Published: |
2007
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Online Access: | http://ndltd.ncl.edu.tw/handle/44939906262874610351 |
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