The Elliposometric Measurements of a curved surface
碩士 === 國立交通大學 === 光電工程系所 === 95 === This work presents a three-intensity measurement technique to determine the ellipsometric parameters (Ψ,Δ) of a curved surface in a polarizer–sample-analyzer (PSA) imaging ellipsometry. After a careful calibration on the azimuth position of the water-surface, we...
Main Authors: | , |
---|---|
Other Authors: | |
Format: | Others |
Language: | zh-TW |
Published: |
2007
|
Online Access: | http://ndltd.ncl.edu.tw/handle/44939906262874610351 |
id |
ndltd-TW-095NCTU5124074 |
---|---|
record_format |
oai_dc |
spelling |
ndltd-TW-095NCTU51240742016-05-04T04:16:29Z http://ndltd.ncl.edu.tw/handle/44939906262874610351 The Elliposometric Measurements of a curved surface 影像式橢圓儀在曲面薄膜量測 Chen Yo Lee 李振佑 碩士 國立交通大學 光電工程系所 95 This work presents a three-intensity measurement technique to determine the ellipsometric parameters (Ψ,Δ) of a curved surface in a polarizer–sample-analyzer (PSA) imaging ellipsometry. After a careful calibration on the azimuth position of the water-surface, we can prove that the azimuth deviation of polarizer is caused by the local surface normal; thus, we not only can determine the radius curvature of the curved surface, we also can correct its incident-angle from the measurement. Moreover, utilizing the ellipsometric parameters, we can calculate the thickness of the thin film coated on a curved surface. Y. F. Chao 趙于飛 2007 學位論文 ; thesis 44 zh-TW |
collection |
NDLTD |
language |
zh-TW |
format |
Others
|
sources |
NDLTD |
description |
碩士 === 國立交通大學 === 光電工程系所 === 95 === This work presents a three-intensity measurement technique to determine the ellipsometric parameters (Ψ,Δ) of a curved surface in a polarizer–sample-analyzer (PSA) imaging ellipsometry. After a careful calibration on the azimuth position of the water-surface, we can prove that the azimuth deviation of polarizer is caused by the local surface normal; thus, we not only can determine the radius curvature of the curved surface, we also can correct its incident-angle from the measurement. Moreover, utilizing the ellipsometric parameters, we can calculate the thickness of the thin film coated on a curved surface.
|
author2 |
Y. F. Chao |
author_facet |
Y. F. Chao Chen Yo Lee 李振佑 |
author |
Chen Yo Lee 李振佑 |
spellingShingle |
Chen Yo Lee 李振佑 The Elliposometric Measurements of a curved surface |
author_sort |
Chen Yo Lee |
title |
The Elliposometric Measurements of a curved surface |
title_short |
The Elliposometric Measurements of a curved surface |
title_full |
The Elliposometric Measurements of a curved surface |
title_fullStr |
The Elliposometric Measurements of a curved surface |
title_full_unstemmed |
The Elliposometric Measurements of a curved surface |
title_sort |
elliposometric measurements of a curved surface |
publishDate |
2007 |
url |
http://ndltd.ncl.edu.tw/handle/44939906262874610351 |
work_keys_str_mv |
AT chenyolee theelliposometricmeasurementsofacurvedsurface AT lǐzhènyòu theelliposometricmeasurementsofacurvedsurface AT chenyolee yǐngxiàngshìtuǒyuányízàiqūmiànbáomóliàngcè AT lǐzhènyòu yǐngxiàngshìtuǒyuányízàiqūmiànbáomóliàngcè AT chenyolee elliposometricmeasurementsofacurvedsurface AT lǐzhènyòu elliposometricmeasurementsofacurvedsurface |
_version_ |
1718255024810754048 |