The Elliposometric Measurements of a curved surface

碩士 === 國立交通大學 === 光電工程系所 === 95 === This work presents a three-intensity measurement technique to determine the ellipsometric parameters (Ψ,Δ) of a curved surface in a polarizer–sample-analyzer (PSA) imaging ellipsometry. After a careful calibration on the azimuth position of the water-surface, we...

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Main Authors: Chen Yo Lee, 李振佑
Other Authors: Y. F. Chao
Format: Others
Language:zh-TW
Published: 2007
Online Access:http://ndltd.ncl.edu.tw/handle/44939906262874610351
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spelling ndltd-TW-095NCTU51240742016-05-04T04:16:29Z http://ndltd.ncl.edu.tw/handle/44939906262874610351 The Elliposometric Measurements of a curved surface 影像式橢圓儀在曲面薄膜量測 Chen Yo Lee 李振佑 碩士 國立交通大學 光電工程系所 95 This work presents a three-intensity measurement technique to determine the ellipsometric parameters (Ψ,Δ) of a curved surface in a polarizer–sample-analyzer (PSA) imaging ellipsometry. After a careful calibration on the azimuth position of the water-surface, we can prove that the azimuth deviation of polarizer is caused by the local surface normal; thus, we not only can determine the radius curvature of the curved surface, we also can correct its incident-angle from the measurement. Moreover, utilizing the ellipsometric parameters, we can calculate the thickness of the thin film coated on a curved surface. Y. F. Chao 趙于飛 2007 學位論文 ; thesis 44 zh-TW
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description 碩士 === 國立交通大學 === 光電工程系所 === 95 === This work presents a three-intensity measurement technique to determine the ellipsometric parameters (Ψ,Δ) of a curved surface in a polarizer–sample-analyzer (PSA) imaging ellipsometry. After a careful calibration on the azimuth position of the water-surface, we can prove that the azimuth deviation of polarizer is caused by the local surface normal; thus, we not only can determine the radius curvature of the curved surface, we also can correct its incident-angle from the measurement. Moreover, utilizing the ellipsometric parameters, we can calculate the thickness of the thin film coated on a curved surface.
author2 Y. F. Chao
author_facet Y. F. Chao
Chen Yo Lee
李振佑
author Chen Yo Lee
李振佑
spellingShingle Chen Yo Lee
李振佑
The Elliposometric Measurements of a curved surface
author_sort Chen Yo Lee
title The Elliposometric Measurements of a curved surface
title_short The Elliposometric Measurements of a curved surface
title_full The Elliposometric Measurements of a curved surface
title_fullStr The Elliposometric Measurements of a curved surface
title_full_unstemmed The Elliposometric Measurements of a curved surface
title_sort elliposometric measurements of a curved surface
publishDate 2007
url http://ndltd.ncl.edu.tw/handle/44939906262874610351
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