Ultrafast Carrier Dynamics of InGaAsxN1-x Single Quantum Wells by Time-Resolved Photoreflectance Measurement

碩士 === 國立交通大學 === 光電工程系所 === 95 === The comparative analysis of the ultrafast carrier dynamics of metal-organic chemical vapor deposition (MOCVD) grown In0.4Ga0.6As and In0.4Ga0.6As0.98N0.02 single quantum wells (SQW) is reported. The incorporation of a low content N in InGaAsN reduces the band-gap...

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Bibliographic Details
Main Authors: Ying-Shu Chen, 陳穎書
Other Authors: Wen-Feng Hsieh
Format: Others
Language:en_US
Published: 2007
Online Access:http://ndltd.ncl.edu.tw/handle/25037698367508354433