Microscopic Characterization of Temperature Effect on Tensile Fracture of Nano-films Via Molecular Dynamics Simulation

碩士 === 國立成功大學 === 機械工程學系碩博士班 === 95 === Thin film is widely applied to the process of connecting the conducting lines in ultra large integration circuit. With the demand of the component becoming slight, multi-layered, highly dense, high speed operating and the product cost, and the effects of stres...

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Bibliographic Details
Main Authors: Jian-Hui Lee, 李建輝
Other Authors: Steven Hsin-Yi Lai
Format: Others
Language:zh-TW
Published: 2007
Online Access:http://ndltd.ncl.edu.tw/handle/23645366740461704719

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