The research of using Six Sigma methodology in practical application－A case study on TFT yield improvement

• Main Authors: Tai-you Lin, 林泰佑
• Other Authors: Chia-Pao Chang
• Format: Others
• Language: zh-TW
• Published: 2007
• Online Access: http://ndltd.ncl.edu.tw/handle/91536337564765861163

碩士 === 國立勤益科技大學 === 工業工程與管理系 === 95 === Six-Sigma represents the high efficiency standard. The definition in statistics is less than 3.4 scraps per million pieces of products. Six-Sigma is basically used to improve and eliminate the variation continually. The goal is to reduce waste and cost and improve efficiency. This research applies Six-Sigma technique on the thin film transistor-liquid crystal display (TFT-LCD) industry to improve yield and cost. The DMAIC five steps is used to improve the process quality and yield of TFT-LCD boards. The DMAIC is the abbreviation of Define (D), Measure (M), Analyze (A), Improve (I) and Control (C). We also use six-sigma technique to module assembly process, by carrying on series of one-time inspection on TFT-LCD board, and then a clear and feasible concrete illustration is proposed by this research.