A Robust Feature-Based Registration Methodfor Differently Exposed Image Sequences

碩士 === 國立中興大學 === 資訊科學系所 === 95 === In feature-based image registration method, the most challenge is to find the features which have high matching accuracy between images. If the pairs of feature can be found correctly between images, the mapping function is constructed. It should transform one ima...

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Main Authors: Yen-liang Chen, 陳彥良
Other Authors: 吳俊霖
Format: Others
Language:zh-TW
Published: 2007
Online Access:http://ndltd.ncl.edu.tw/handle/92753043115389784294
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spelling ndltd-TW-095NCHU53940422016-05-23T04:18:28Z http://ndltd.ncl.edu.tw/handle/92753043115389784294 A Robust Feature-Based Registration Methodfor Differently Exposed Image Sequences 一個不同曝光時間影像序列之強健特徵導向影像定位法 Yen-liang Chen 陳彥良 碩士 國立中興大學 資訊科學系所 95 In feature-based image registration method, the most challenge is to find the features which have high matching accuracy between images. If the pairs of feature can be found correctly between images, the mapping function is constructed. It should transform one image to overlay it over the other one. Scale Invariant Feature Transform (SIFT) is a robust feature transform for feature detection and descriptor. The features are invariant to image scale and rotation, and are shown to provide robust matching across a substantial range of affine distortion, change in viewpoint, addition of noise and change in illumination. But if the source images have large change in illumination and the existence of similar objects, the matching will fail. In matching time, SIFT spends too much time on sorting. In this thesis, we use the median threshold bitmap (MTB) to solve the large change in illumination problem and estimate the texture parameter with normalized (R) and entropy (E) to improve the existence of similar objects. In feature matching, we use partial sum to improve matching time. The experimental results show that the proposed method can improve and solve the problems above effectively and shorten the matching time. 吳俊霖 2007 學位論文 ; thesis 51 zh-TW
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description 碩士 === 國立中興大學 === 資訊科學系所 === 95 === In feature-based image registration method, the most challenge is to find the features which have high matching accuracy between images. If the pairs of feature can be found correctly between images, the mapping function is constructed. It should transform one image to overlay it over the other one. Scale Invariant Feature Transform (SIFT) is a robust feature transform for feature detection and descriptor. The features are invariant to image scale and rotation, and are shown to provide robust matching across a substantial range of affine distortion, change in viewpoint, addition of noise and change in illumination. But if the source images have large change in illumination and the existence of similar objects, the matching will fail. In matching time, SIFT spends too much time on sorting. In this thesis, we use the median threshold bitmap (MTB) to solve the large change in illumination problem and estimate the texture parameter with normalized (R) and entropy (E) to improve the existence of similar objects. In feature matching, we use partial sum to improve matching time. The experimental results show that the proposed method can improve and solve the problems above effectively and shorten the matching time.
author2 吳俊霖
author_facet 吳俊霖
Yen-liang Chen
陳彥良
author Yen-liang Chen
陳彥良
spellingShingle Yen-liang Chen
陳彥良
A Robust Feature-Based Registration Methodfor Differently Exposed Image Sequences
author_sort Yen-liang Chen
title A Robust Feature-Based Registration Methodfor Differently Exposed Image Sequences
title_short A Robust Feature-Based Registration Methodfor Differently Exposed Image Sequences
title_full A Robust Feature-Based Registration Methodfor Differently Exposed Image Sequences
title_fullStr A Robust Feature-Based Registration Methodfor Differently Exposed Image Sequences
title_full_unstemmed A Robust Feature-Based Registration Methodfor Differently Exposed Image Sequences
title_sort robust feature-based registration methodfor differently exposed image sequences
publishDate 2007
url http://ndltd.ncl.edu.tw/handle/92753043115389784294
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