| Summary: | 碩士 === 國立高雄應用科技大學 === 電子與資訊工程研究所碩士班 === 95 === As the complexity of integrated Radio frequency circuits has growth, the complexity of testing theme has also growth. For some devices, the largest portion of manufacturing cost is testing. To perform such complex testing, Automated test Equipment (ATE) and test method is used.
Another one of the challenges in the RF IC testing is that modern digital communications systems has brought to radio frequency engineering needs for end-to-end performance measurements is EVM (Error Vector Magnitude) and BER (Bit Error Rate) testing. EVM and BER provide a single figure of merit that summarizes a device performance under real life conditions.
In the traditional EVM testing it’s only works in the IC design house - LAB solution. Tester is limited in the test instrument performance and EVM result in a degradation of about 5% to 20% EVM error. We Described the EVM theoretical method to calculate the EVM performance on the digital communication system to make it can production in ATE and EVM error between 2%. An example of 802.11b system measurement was described in the paper.
BER (Bit Error Rate), which quantifies the reliability of the entire radio system from bit in to bit out, including the electronics, antennas and signal path in between. An example of this is a single RF front-end bluetooth chip was present here and integrate the base band circuit in the probe-card with FPGA circuit.
We describe the theoretical method to calculate bit error rate (BER) performance of a GFSK system. The receiver tests consist of a series of bit error rate (BER) tests done at different carrier frequencies and power levels.
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