A study of memory IC test platform conversion
碩士 === 義守大學 === 電子工程學系半導體暨封裝測試產業研發碩士 === 95 === Memory IC testing cost has been a key problem in testing house for this decade and expects the same issue for the next decade. With their growing density and capacity, the test time grows rapidly if the test methodologies and equipments remain the same...
| Main Authors: | , |
|---|---|
| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Online Access: | http://ndltd.ncl.edu.tw/handle/58694318974698799523 |