| Summary: | 碩士 === 逢甲大學 === 電子工程所 === 95 === Coupled noise between signal lines is a potential cause of failure in high-speed electronic systems. It is well accepted that on-chip interconnect plays an important role in the performance and signal integrity of deep submicrometer VLSI circuits. Being increasing of digital and analog components on the same chip, interconnect lines become more density. Owing to the distance between the interconnect lines very closed to each others, the coupled effect will be introduced from the coupled capacitors. In this thesis, a new approach to evaluate the transmission affected by the coupled effect is proposed. Based on pole-zero analysis of the sensitivity function, the optimum operation frequency region can be determined by the proposed approach. From the simulation results, the performance of the advocated methodology can be demonstrated.
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