| Summary: | 碩士 === 逢甲大學 === 化學工程學所 === 95 === In this paper, the experiments we performed are to deposit poly[2-methoxy-5-(2-ehtylhexoy)- 1，4 - phenylene vinylene] (MEH-PPV) thin films on insulating mica by spin-coating, and to deposit polythiophene thin films on insulating mica by admicellar polymerization (AP). Morphology imaging using atomic force microscopy (AFM) and conductance measurements by a sub-femto-amp SourceMeter were performed. The current-voltage (I-V) curves were obtained at several different concentrations. AFM images observe the fractal structure on MEH-PPV coated surface, and conductance measurements by sub-femto-amp SourceMeter exhibit a non-linear relationships with concentrations. The result agrees with the power law relationship of fractal analysis. In the experiments of AP procedures in two solutions, we can see different polymer distribution and shapes caused by different surfactants, and the effect of surfactant in the first solution on monomer adsorbed on mica surface. In addition, the surfactants exist or not in second solution are essential to the completeness and the distribution of the thin films.
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