Automatic Detection of Special Defects of Non-Uniformityon Cabon Nanotube Backlight Units

• Main Authors: Shiau-Tin Lee, 李曉婷
• Other Authors: Wen-Chieh Chuang
• Format: Others
• Language: zh-TW
• Published: 2007
• Online Access: http://ndltd.ncl.edu.tw/handle/14356307884437669569

碩士 === 逢甲大學 === 工業工程與系統管理學研究所 === 95 === Many flat panel display’s manufacturers want to develop large size LCD actively in Taiwan, but it be limited to LCD backlight unit of CCFL technology, The CCFL technology has the expensive and the environmental problems. Then the manufacturers inorder to solve these problem, so they need to develop new backlight unit technology to replace CCFL-BLU at present very soon. And cabon nanotube backlight unit (CNT-BLU) has been considered to replace LCD backlight unit of CCFL now. CNT-BLU be manufactured by thick film screen printing processes. It has some advantagesm. It has less cost than traditional backlight products, not has environmental problem, and it is suitable for large size panels. However CNT-BLU is manufactured on laboratory now, so CNT-BLU has many problems about manufacturing processes, and the serious problem is about emission uniformity. While the uniformity problems are different from CCFL-based backlight units, new methodologies that can be used to identify or to measure such uniformity need to be developed. This research aims at a type of uniformity defects that only occurs on CNT-BLU called “light rings”. Using digital image processing techniques, an automatic detection and measurement mythology is developed to locate and separate those light rings from background. A quantitative index can be therefore developed to measure the significance of the light ring defects on a CNT-BLU. The results of this research can serve as a basis to find the optimal parameters for CNT-BLU manufacturing.