Yield-Driven Wiring and Via Improvement with Timing Consideration

碩士 === 中華大學 === 資訊工程學系(所) === 95 === In VDSM technologies, the process variation becomes more and more serious. Due to the difficulty of lithography and manufacture in nanometer process, the concept of yield-driven design becomes more and more important for modern chip designs. For a given design, t...

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Bibliographic Details
Main Authors: Bo-Yi Chiang, 江柏毅
Other Authors: Jin-Tai Yan
Format: Others
Language:zh-TW
Published: 2007
Online Access:http://ndltd.ncl.edu.tw/handle/08246461708106363319

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