The Practical Analysis and Research of Integrated Circuit Testing

• Main Authors: Ching-Tsung Chen, 陳景聰
• Other Authors: Ren-Der Chen
• Format: Others
• Language: zh-TW
• Published: 2007
• Online Access: http://ndltd.ncl.edu.tw/handle/51268108730811765623

碩士 === 長庚大學 === 電機工程研究所 === 95 === With the increasing circuit complexity and IC density, testing has played a more and more important role for the semiconductor industry. Testing has shifted from the final fabricated IC stage to the design stage. In any event, test engineering is an indispensable part of the IC manufacturing process. What is testing? Testing means a standard or criteria by which the quality of the chip conforms to. The objective of testing is to check whether the device meets the design specification or not. As the complexity of IC increasing, the cost of testing usually takes up a relatively high percentage of the total IC manufacturing cost. “How to test the device cheaply and accurately?” becomes one important topic. This paper performs a detailed view of the testing process and discusses different types of testing methods including DC test, function test, and design for test systematically. Finally experimental results present two cases study. Case 1 performs the detailed practical flow of one test program development from the first load board design to the final test program implement. Case 2 presents the device characterization under different temperatures.