Dictionary based Data Compression for SOC with Multiple Scan Chains

碩士 === 元智大學 === 資訊工程學系 === 94 === Reducing test application time and test data volume are major challenges in SoC design. In this thesis we propose a new dictionary-based test data encoding technique for multiscan-based designs. To reduce the data volume transferred from ATE to the core under test,...

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Bibliographic Details
Main Authors: Kuo-En Tseng, 曾國恩
Other Authors: 曾王道
Format: Others
Language:zh-TW
Published: 2006
Online Access:http://ndltd.ncl.edu.tw/handle/95880643828728291356