Dictionary based Data Compression for SOC with Multiple Scan Chains
碩士 === 元智大學 === 資訊工程學系 === 94 === Reducing test application time and test data volume are major challenges in SoC design. In this thesis we propose a new dictionary-based test data encoding technique for multiscan-based designs. To reduce the data volume transferred from ATE to the core under test,...
Main Authors: | , |
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Other Authors: | |
Format: | Others |
Language: | zh-TW |
Published: |
2006
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Online Access: | http://ndltd.ncl.edu.tw/handle/95880643828728291356 |